CLA-2-90:S:N:N3:114 802690
Ms. Dagmar Mackay
Terminal Drive
Plainview, NY 11803
RE: The tariff classification of Integrated Silicon Cantilever
GMTC Micromechanical Tip from Germany
Dear Ms. Mackay:
In your letter dated September 20, 1994 you requested a tariff
classification ruling on an integrated silicon cantilever GMTC
micromechanical tip for an atomic force microscope.
The micromechanical tip is an accessory for an atomic force
microscope (AFM). The probe tip, which is composed of silicon, is
scanned across a surface in a raster pattern. The atomic force
microscope measures the interaction between the surface and the
probe tip. The AFM is an imaging tool which allows for the imaging
of very small features. The image is viewed on a monitor or is
printed out on a printer. The microscope is used in research and
development in the semiconductor industry.
The applicable subheading for the integrated silicon
cantilever GMTC micromechanical tip for an atomic force microscope
will be 9012.90.0000, Harmonized Tariff Schedule of the United
States (HTS), which provides for parts and accessories for
microscopes other than optical microscopes. The rate of duty will
be 6.2 percent ad valorem.
This ruling is being issued under the provisions of Section
177 of the Customs Regulations (19 C.F.R. 177).
A copy of this ruling letter should be attached to the entry
documents filed at the time this merchandise is imported. If the
documents have been filed without a copy, this ruling should be
brought to the attention of the Customs officer handling the
transaction.
Sincerely,
Jean F. Maguire
Area Director
New York Seaport