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Decision on Application for Further Review of Protest No. 2809-94-100266.
Protest 1704-02-100302; CD-Scanning Electron Microscope
Optical memory subsystem; scanning electron microscope;heading 8471; subheading 8471.91.00; Chapter 84, note5(A)(a); ENs 90.12 (A); Chapter 90, note 2(b); United States-Canada Free-Trade Agreement; General Note 3(c)(vii)(B).
Protest Number 2904-02-100316; Dual Beam System; Scanning Electron Microscope; Handling and Transport Equipment; ITA.
The tariff classification of Integrated Silicon Cantilever GMTC Micromechanical Tip from Germany