Classification of the AC-4780 Array Test System
The tariff classification of Wafer Probers from Japan
The tariff classification of Integrated Circuit Handlers from Japan
The tariff classification of Test Burn-in Test Systems from Japan
Protest 3901-97-101872; Dynamic Test Handlers
The tariff classification of semiconductor test equipment from Italy
The tariff classification of an Integrated Development Platform from China.
The tariff classification of a Core Development Platform (CDP) from Taiwan
The tariff classification of focused ion beam semiconductor manufacturing equipment from the United States
Revocation of Headquarters Ruling Letters (HQ) H011054 and HQ H011056; tariff classification of wafer probe cards