• 1.0
• NY D89035
• Mar 25, 1999

• Type: Classification • HTSUS: 9031.41.0040; 9031.49.9000
  

The tariff classification of Nidek Flatness Tester Model FT-11, Nidek Flatness Tester Model FT-12, Nidek Flatness Tester Model FT-3D, Nidek Flatness Tester Model FT-900 and Himec Wafer Cassette Inspection Machine Model CA-008A from Japan

• 1.0
• NY c81315
• Nov 18, 1997

• Type: Classification • HTSUS:
  

The tariff classification of Nikon Optistations from Japan.

• 1.0
• NY E80052
• Apr 05, 1999

• Type: Classification • HTSUS: 9031.41.0040
  

The tariff classification of Wafer Auto Loaders from Japan

• 1.0
• NY N276333
• Jul 06, 2016

• Type: Classification • HTSUS: 9031.41.0040; 9031.80.8085
  

The tariff classification of wafer loaders from Japan

• 1.0
• NY D88817
• Mar 23, 1999

• Type: Classification • HTSUS: 9031.41.0040
  

The tariff classification of a Laser Electro Optics Edge (LEO) Profile Monitor Model LEP-820, Laser Electro Optics Edge Profile Monitor Model LEP-810, Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1000EP and Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1200EP from Japan

• 1.0
• NY b89495
• Oct 10, 1997

• Type: Classification • HTSUS: 9027.80.4590; 9031.41.0040
  

The tariff classification of a Deep Level Transient Spectrometer and a Lifetime Scanner from Hungary

• 1.0
• NY b89229
• Sep 24, 1997

• Type: Classification • HTSUS: 9031.41.0040
  

The tariff classification of the WT-85 Lifetime Scanner from Hungary

• 1.0
• NY h89484
• Mar 26, 2002

• Type: Classification • HTSUS: 9031.41.0040
  

The tariff classification of the Caliper 3oomm Overlay Measurement Tool from the United Kingdom