• 1.0
• HQ 966296
• Jan 23, 2004

• Type: Classification • HTSUS: 9031.80.40
   Related:   962435; 966482   

Protest 1704-02-100302; CD-Scanning Electron Microscope

• 1.0
• HQ 966482
• Aug 19, 2003

• Type: Classification • HTSUS: 9031.80.40
   Revokes:   962435     Related:   965639; 954682; 950196; 959109; 962435   

CD Measurement and Inspection Scanning Electron Microscope fitted with equipment specifically designed for the handling and transport of semiconductor wafers; Revocation of HQ 962435

• 1.0
• HQ 962435
• Dec 15, 1999

• Type: Classification • HTSUS: 9012.10.00
   Revoked by:   966482     Related:   088231   

Protest 1001-98-102442; Measurement and Inspection SEM Microscope, Model MI-3080; Microscopes, Other than Optical Microscopes

• 1.0
• NY R03296
• Mar 10, 2006

• Type: Classification • HTSUS: 9012.10.0000
   Related:   R02833   

The tariff classification of the Nova 200 NanoLab

• 1.0
• HQ 966185
• Feb 18, 2004

• Type: Classification • HTSUS: 9031.80.40
   Related:   959109; 962435; 966482   

Protest Number 2904-02-100316; Dual Beam System; Scanning Electron Microscope; Handling and Transport Equipment; ITA.

• 1.0
• NY N013658
• Jul 24, 2007

• Type: Classification • HTSUS: 9031.80.4000
   Related:   966185   

The tariff classification of Expida Dual Beam Semiconductor Apparatus from the Netherlands

• 1.0
• NY N084236
• Dec 08, 2009

• Type: Classification • HTSUS: 9012.10.0000; 9031.80.4000
   Related:   962435; 966482   

The tariff classification of scanning electron microscopes from Czech Republic